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Scanning Electron Microscopy with EDX-analysis

 

Services SEM/EDX

 
Contact: Lars Andersson & Catarina Wernlund

Safe Control can offer a wider and deeper range of services.
With our scanning electron microscope, our laboratory gets
an increased flexibility and can perform more and better
examinations/analyses for our customers.

A scanning electron microscope (SEM) is used for, among
other things, to make enlarged representations of smaller
objects and particles. The benefit of an SEM is the possibility
to examine surfaces in a very high magnification, with a
maximum magnification up to 300 000x. Compared to
an optical microscope the depth of field is much greater,
which makes it suitable for examining surfaces of breaks,
for instance. The greatest difference between SEM and an
optical microscope is that a SEM uses electrons instead of light.
With our instrument, analyses can be performed in both high
and low vacuum. If the examination is performed in high
vacuum the sample must be conductive. In cases where the
sample is non conductive it can be coated with a conductive
layer of gold or alternately carbon. In low vacuum practically
any samples can be examined and analysed.

Our SEM is also equipped with an energy-dispersive
X-ray spectroscope (EDS/EDX). It gives us the ability to analyse
the chemical composition of the examined surface, from
a both qualitative and quantitative perspective. We can perform
a survey analysis of an area (area analysis) and/or analyse
a specific small stretch, a so called spot check. Examples of
fields of applications can be analyses of particles, coatings,
corrosion products and asbestos fibres. Through a line analysis
we can show variations in the chemical composition along
a chosen line, which favourably can be used to analyse surface
layers. We can also perform a mapping of the composing
chemical elements, and show their distribution and concentration.
The result of the aforementioned analyses can be presented
as spectrums, in tables, graphs and picture form.

Safe Controls equipment: JEOL-6510A/JSM-6510LA

 

SEM/EDS
JEOL-6510A/JSM-6510LA



Zinkskikt

 Layer of zinc

 

 

 

Asbest

Asbestos fibres


 

 

Examination and analysis of:

  • Fracture surfaces 
  • Coatings/deposits 
  • Corrosion products 
  • Material identification
    (metal particulates, powders etc.)
  • Distribution of composing
    elements (x-ray mapping)
  • Phases in microstructure
    (brittle phases among other things)
  • Slag inclusions in
    macro/micro samples
  • Asbestos (dust, air and
    water samples)
  • Environmental samples (for heavy metals for instance)
  • Paint (for copper and lead
    for instance) 
  • Surface layers 
  • Cracks